Studies of Ag Diffusion Processes into Thin-Film As2s3 Structures Doped With Sn under the Exposure of X-Ray Radiation

The processes of silver diffusion into thin-film structures (As2S3)0,995Sn0,005 under the X-ray radiation were studied. Thin-film layers silver, about 12 nm thick, deposited by vacuum thermal evaporation on surface. thin layer irradiated with in range absorbed doses 0,3-0,6 Gy using tube a copper anode (voltage 45 kV, current 40 mA) as an source without any filters (the continuous spectrum X-ray, or “white” spectrum). possibility images recording their subsequent visualization chemical etching 5% solution NaOH is shown.